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分划板或镜台测微尺

Reticles are used to add measurement or comparison capability to a variety of microscopes. Reticles are clear discs marked with a scale or pattern. Reticles are available in a wide range of patterns, including crossline, micrometer scales, or grids. Stage micrometers are also available for calibrating microscope reticles or objective powers.

同心圆分划板透射分划板

Designed for 1X Objective Power
Concentric Circle Pattern
B270 Substrate

Clearance

十字测微尺透射分划板

适用于1倍放大率物镜
5毫米或10毫米刻度
1.5毫米厚度

十字分叉线透射分划板

Designed for 1X Objective Power
Crossline Pattern
19 or 21mm Diameter Versions

水平测微尺透射分划板

Designed for 1X Objective Power
1, 5, or 10mm Scale Versions
0.1 or 0.5 Inch Scale Versions

指示栅格透射分划板

Designed for 1X Objective Power
Indexed Grid Pattern
19 or 21mm Diameter Reticles

网状栅格透射分划板

Designed for 1X Objective Power
Net Grid Squares over Entire Field
19 or 21mm Diameter Versions

量角器透射分划板

Designed for 1X Objective Power
1 Degree Increments with Every 10 Degrees Labeled
Total Pattern Over a 10mm Diameter

定标镜台测微分划板

Features a Series of "H" Shaped Fiducial Images
Image Sizes from 0.1 to 20mm
Available with NIST Traceable Data

台式测微尺

用于安装在显微镜载物台上的刻度居中分划板
用于常规校准的设计
1 x 3" 载玻片尺寸

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