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分划板或镜台测微尺

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同心圆分划板透射分划板 同心圆分划板透射分划板
  • Designed for 1X Objective Power
  • Concentric Circle Pattern
  • B270 Substrate
十字测微尺透射分划板 十字测微尺透射分划板
  • Designed for 1X Objective Power
  • 5 or 10mm Scale
  • 1.5mm Thickness
十字分叉线透射分划板 十字分叉线透射分划板
  • Designed for 1X Objective Power
  • Crossline Pattern
  • 19 or 21mm Diameter Versions
水平测微尺透射分划板 水平测微尺透射分划板
  • Designed for 1X Objective Power
  • 1, 5, or 10mm Scale Versions
  • 0.1 or 0.5 Inch Scale Versions
指示栅格透射分划板 指示栅格透射分划板
  • Designed for 1X Objective Power
  • Indexed Grid Pattern
  • 19 or 21mm Diameter Reticles
网状栅格透射分划板 网状栅格透射分划板
  • Designed for 1X Objective Power
  • Net Grid Squares over Entire Field
  • 19 or 21mm Diameter Versions
量角器透射分划板 量角器透射分划板
  • Designed for 1X Objective Power
  • 1 Degree Increments with Every 10 Degrees Labeled
  • Total Pattern Over a 10mm Diameter
定标镜台测微分划板 定标镜台测微分划板
  • Features a Series of "H" Shaped Fiducial Images
  • Image Sizes from 0.1 to 20mm
  • Available with NIST Traceable Data
台式测微尺 台式测微尺
  • Reticle Scales Centered on Microscope Slides
  • Designed for Routine Calibration
  • 1 x 3" Slide Sizes

Reticles are used to add measurement or comparison capability to a variety of microscopes. Reticles are clear discs marked with a scale or pattern. Reticles are available in a wide range of patterns, including crossline, micrometer scales, or grids. Stage micrometers are also available for calibrating microscope reticles or objective powers.

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