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分划板

Contact Reticles are used to provide measurement capabilities to a number of different magnifiers by adding fixed measurement guides that are visible against an examined subject. Contact Reticles are attached to a magnifier's lens, adding a fixed measurement tool to the magnifier. Contact Reticles are available in a number of different formats designed for various kinds of measurement including crosshair, linear, circular, or multi scale.

Edmund 21mm, 26mm, 27mm, 和 35mm 接触式分划板- 环形标度圆标尺
Edmund 21mm, 26mm, 27mm, 和 35mm 接触式分划板- 环形标度圆标尺
  • Greater Stabiliy than Film Reticles
  • Low Reflection Chrome Pattern
  • Protractor, Crosshair, or Concentric Square Patterns
爱特蒙特21MM, 26MM, 27MM, 以及 35MM接触型分划板
爱特蒙特21MM, 26MM, 27MM, 以及 35MM接触型分划板
  • Greater Stabiliy than Film Reticles
  • Low Reflection Chrome Pattern
  • Plain or Dashed Crosshairs
Edmund 接触式分划板 - 格网比例尺
Edmund 接触式分划板 - 格网比例尺
  • Greater Stabiliy than Film Reticles
  • Low Reflection Chrome Pattern
  • English or Metric Index Square Scales
线性标度接触式分划板
线性标度接触式分划板
  • Greater Stabiliy than Film Reticles
  • Low Reflection Chrome Pattern
  • English and Metric Styles
多刻度接触分划板
多刻度接触分划板
  • Greater Stabiliy than Film Reticles
  • Low Reflection Chrome Pattern
  • English or Metric Styles
Edmund 21mm, 26mm, 27mm, 和 35mm 接触式分划板- 厚度规/孔规
Edmund 21mm, 26mm, 27mm, 和 35mm 接触式分划板- 厚度规/孔规
  • Greater Stabiliy than Film Reticles
  • Low Reflection Chrome Pattern
  • Compatible with 6 or 9X Comparitors

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